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Tip enhanced Raman spectroscopy for high resolution assessment of strained silicon devices

Lookup NU author(s): Lisa Sanderson, Dr Piotr Dobrosz, Dr Sarah Olsen, Professor Steve BullORCiD

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Publication metadata

Author(s): Sanderson L, Dobrosz P, Olsen SH, Bull SJ, Mantl S, Buca D

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 36th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2009)

Year of Conference: 2009

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