Toggle Main Menu Toggle Search

Open Access padlockePrints

Monitoring circuit based on threshold for fault-tolerant NoC

Lookup NU author(s): Li Dai, Dr Delong Shang, Dr Fei Xia, Professor Alex Yakovlev

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


Abstract

As CMOS technology continues to scale down, reliability has become one of the most crucial issues in network-on-chip (NoC). A novel NoC monitoring circuit based on fault thresholds is proposed. This circuit is able to distinguish not only transient faults but also non-transient faults in NoC data links and routers with low area and power overhead.


Publication metadata

Author(s): Dai L, Shang D, Xia F, Yakovlev A

Publication type: Letter

Publication status: Published

Journal: Electronics Letters

Year: 2010

Volume: 46

Issue: 14

Pages: 984-985

Print publication date: 08/07/2010

ISSN (print): 0013-5194

ISSN (electronic): 1350-911X

URL: http://dx.doi.org/10.1049/el.2010.0634

DOI: 10.1049/el.2010.0634


Share