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Crack Evaluation based on Novel Circle-ferrite Induction Thermography

Lookup NU author(s): Dr Bin Gao, Dr Wai Lok Woo, Professor Gui Yun TianORCiD

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Publication metadata

Author(s): Zhao J, Gao B, Woo WL, Fasheng Q, Tian GY

Publication type: Article

Publication status: Published

Journal: IEEE Sensors Journal

Year: 2017

Volume: 17

Issue: 17

Pages: 5637-5645

Online publication date: 04/07/2017

Acceptance date: 01/07/2017

ISSN (print): 1530-437X

ISSN (electronic): 1558-1748

Publisher: Institute of Electrical and Electronics Engineers Inc.

URL: https://doi.org/10.1109/JSEN.2017.2723432

DOI: 10.1109/JSEN.2017.2723432

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