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Browsing publications by Professor Peter Cumpson.

Newcastle AuthorsTitleYearFull text
Professor Peter Cumpson
Argon cluster-ion sputter yield: Molecular dynamics simulations on silicon and equation for estimating total sputter yield2022
Hang Xiang
Dr Shahid Rasul
Dr Jose Portoles
Professor Peter Cumpson
Professor Eileen Yu
et al.
Copper–Indium Binary Catalyst on a Gas Diffusion Electrode for High-Performance CO2 Electrochemical Reduction with Record CO Production Efficiency2020
Dr Sabrina Tardio
Professor Peter Cumpson
Professor Grant Burgess
Antimicrobial properties of Cu-based bulk metallic glass composites after surface modification2019
Dr Sadia Sheraz
Professor John Vickerman
Professor Peter Cumpson
Enhanced Ion Yields Using High Energy Water Cluster Beams for Secondary Ion Mass Spectrometry Analysis and Imaging2019
Hang Xiang
Dr Shahid Rasul
Emeritus Professor Keith Scott
Dr Jose Portoles
Professor Peter Cumpson
et al.
Enhanced selectivity of carbonaceous products from electrochemical reduction of CO2 in aqueous media2019
Dr Anders Barlow
Dr Naoko Sano
Dr Billy Murdoch
Dr Jose Portoles
Professor Peter Cumpson
et al.
Observing the evolution of regular nanostructured indium phosphide after gas cluster ion beam etching2018
Dr Sabrina Tardio
Professor Peter Cumpson
Practical estimation of XPS binding energies using widely available quantum chemistry software2018
Dr Anders Barlow
Michael Foster
Dr Mariela Bravo Sanchez
Dr Jose Portoles
Dr Naoko Sano
et al.
In situ ion beam sputter deposition and X-ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis2017
Dr Graham Purvis
Professor Neil Gray
Dr Naoko Sano
Dr Anders Barlow
Dr Geoffrey Abbott
et al.
Decontamination of geological samples by gas cluster ion beam etching or ultra violet/ozone2017
Dr Dragos Neagu
Dr Evangelos Papaioannou
Dr Billy Murdoch
Dr Anders Barlow
Professor Peter Cumpson
et al.
Demonstration of chemistry at a point through restructuring and catalytic activation at anchored nanoparticles2017
Professor Peter Cumpson
Dr Naoko Sano
Stability of Reference Masses VIII: X-ray Fluorescence (XRF) as a Noncontact, Nondestructive Measurement Method for Trace Mercury Contamination of Platinum-Group Metal Surfaces2017
Dr Billy Murdoch
Professor Ian Fletcher
Professor Peter Cumpson
The plasmonic properties of argon cluster-bombarded InP surfaces2017
Srinivas Ganti
Dr Peter King
Dr Erhan Arac
Dr Billy Murdoch
Professor Peter Cumpson
et al.
Voltage Controlled Hot Carrier Injection Enables Ohmic Contacts Using Au Island Metal Films on Ge2017
Dr Mariela Bravo Sanchez
Dr Naoko Sano
Professor Peter Cumpson
Water as a catalytic switch in the oxidation of aryl alcohols by polymer incarcerated rhodium nanoparticles2017
Dr Anders Barlow
Sinziana Popescu
Dr Naoko Sano
Dr John Hedley
Professor Peter Cumpson
et al.
Chemically specific identification of carbon in XPS imaging using Multivariate Auger Feature Imaging (MAFI)2016
James Hood
Professor Peter Cumpson
Design and Manufacture of a High Resolution Orbital-Trapping Mass-Analyser for Secondary Ion Mass Spectrometry2016
Dr Naoko Sano
Dr Graham Purvis
Dr Anders Barlow
Dr Geoffrey Abbott
Professor Neil Gray
et al.
Gas cluster ion beam for the characterization of organic materials in submarine basalts as Mars analogs2016
Professor Peter Cumpson
Professor Ian Fletcher
Richie Burnett
Dr Naoko Sano
Dr Anders Barlow
et al.
Multispectral Optical Imaging Combined in situ with XPS or ToFSIMS and Principal Component Analysis2016
Dr Naoko Sano
Dr Anders Barlow
Professor Peter Cumpson
Optimal conditions for gas cluster ion beams in studying inorganic interface species: improved chemical information at a ZnO interface2016
Professor Peter Cumpson
Professor Ian Fletcher
Dr Naoko Sano
Dr Anders Barlow
Rapid Multivariate Analysis of 3D ToF-SIMS Data: Graphical Processor Units (GPUs) and Low Discrepancy Subsampling for Large-Scale Principal Component Analysis2016
Dr Anders Barlow
Dr Jose Portoles
Dr Naoko Sano
Professor Peter Cumpson
Removing Beam Current Artefacts in Helium Ion Microscopy: A Comparison of Image Processing Techniques2016
Dr Naoko Sano
Professor Peter Cumpson
Surface analysis characterisation of gum binders used in modern watercolour paints2016
Dr Billy Murdoch
Dr Jose Portoles
Dr Sabrina Tardio
Dr Anders Barlow
Professor Ian Fletcher
et al.
Visible wavelength surface-enhanced Raman spectroscopy from In-InP nanopillars for biomolecule detection2016
Professor Peter Cumpson
Dr Naoko Sano
Professor Ian Fletcher
Dr Jose Portoles
Dr Mariela Bravo Sanchez
et al.
Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method2015
Dr Anders Barlow
Dr Naoko Sano
Professor Peter Cumpson
Multivariate Auger Feature Imaging (MAFI) - a new approach towards chemical state identification of novel carbons in XPS imaging2015
Professor Peter Cumpson
A three-dimensional Mn3O4 network supported on a nitrogenated graphene electrocatalyst for efficient oxygen reduction reaction in alkaline media2014
Dr Peter King
Dr Erhan Arac
Srinivas Ganti
Sami Ramadan
Dr Kelvin Kwa
et al.
Fermi Level De-pinning In Metal-Semiconductor Contacts Via Nanometre-scale ALD Dielectric Films2014
Dr Naoko Sano
Professor Peter Cumpson
Multivariate analysis studies of the ageing effect for artist's oil paints containing modern organic pigments2014
Dr Anders Barlow
Dr Jose Portoles
Professor Peter Cumpson
Observed damage during Argon gas cluster depth profiles of compound semiconductors2014
Professor Peter Cumpson
Oxygen reduction reaction by electrochemically reduced graphene oxide2014
Professor Peter Cumpson
Recent Developments in the Study of the Surface-Stability of Platinum and Platinum-Iridium Mass Standards2014
Dr Jose Portoles
Professor Peter Cumpson
A compact torsional reference device for easy, accurate and traceable AFM piconewton calibration2013
Professor Peter Cumpson
Dr Jose Portoles
Dr Anders Barlow
Dr Naoko Sano
Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry2013
Professor Peter Cumpson
Dr Jose Portoles
Dr Anders Barlow
Dr Naoko Sano
Dr Mark Birch
et al.
Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications2013
Dr Enrique Escobedo-Cousin
Dr Konstantin Vasilevskiy
Dr Toby Hopf
Professor Nick Wright
Professor Anthony O'Neill
et al.
Local solid phase growth of few-layer graphene on silicon carbide from nickel silicide supersaturated with carbon2013
Professor Peter Cumpson
Dr Jose Portoles
Dr Naoko Sano
Material dependence of argon cluster ion sputter yield in polymers: Method and measurements of relative sputter yields for 19 polymers2013
Professor Peter Cumpson
Dr Jose Portoles
Dr Naoko Sano
Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers2013
Dr Enrique Escobedo-Cousin
Dr Toby Hopf
Professor Anthony O'Neill
Dr Alton Horsfall
Professor Jon Goss
et al.
Optimising the Growth of Few-Layer Graphene on Silicone Carbide by Nickel Silicidation2013
Professor Peter Cumpson
Dr Naoko Sano
Stability of reference masses V: UV/ozone treatment of gold and platinum surfaces2013
Professor Peter Cumpson
Dr Naoko Sano
Dr Anders Barlow
Dr Jose Portoles
Stability of Reference Masses VII. Cleaning methods in air and vacuum applied to a platinum mass standard similar to the international and national kilogram prototypes2013
Professor Peter Cumpson
Dr Jose Portoles
Dr Naoko Sano
Dr Anders Barlow
Stability of reference masses: VI. Mercury and carbonaceous contamination on platinum weights manufactured at a similar time as the international and national prototype kilograms2013
Professor Peter Cumpson
Dr Jose Portoles
Dr Naoko Sano
Dr Anders Barlow
X-ray enhanced sputter rates in argon cluster ion sputter-depth profiling of polymers2013
Professor Peter Cumpson
Effective platform for the generation of aerosol droplets and application in evaluating the effectiveness of a MEMS-based nanoparticle trapping device2009
Professor Peter Cumpson
Dr John Wolstenholme
Report on the 47th IUVSTAworkshop 'angle-resolved XPS: The current status and future prospects for angle-resolved XPS of nano and subnano films'2009
Professor Peter Cumpson
A multidisciplinary approach to the identification of reference materials for engineered nanoparticle toxicology2008
Professor Peter Cumpson
Dr Jose Portoles
Cantilever Spring-Constant Calibration in Atomic Force Microscopy2008
Professor Peter Cumpson
Nano-scale shear mode testing of the adhesion of nanoparticles to a surface-support2008
Professor Peter Cumpson
Directly writing with nanoparticles at the nanoscale using dip-pen nanolithography2007
Dr Jingzhuo Wang
Professor Peter Cumpson
Modelling of angle-resolved X-ray photoelectron spectroscopy (ARXPS) intensity ratios for nanocharacterisation of closely packed shell-core nanofibres2007
Professor Peter Cumpson
The detection of airborne carbon nanotubes in relation to toxicology and workplace safety2007
Dr Jose Portoles
Professor Peter Cumpson
Dr John Hedley
Accurate velocity measurements of AFM-cantilever vibrations by Doppler interferometry2006
Professor Peter Cumpson
Metrology at the nano scale2005
Professor Peter Cumpson
Dr John Hedley
Microelectromechanical device for lateral force calibration in the atomic force microscope: Lateral electrical nanobalance2005
Professor Peter Cumpson
Dr John Hedley
A microfabricated spring-constant calibration device for atomic force microscopy (AFM) potentially traceable to the SI2004
Dr John Hedley
Emeritus Professor James Burdess
Dr Alun Harris
Dr Barry Gallacher
Emeritus Professor Calum McNeil
et al.
An optical workstation for characterization and modification of MEMS2004
Professor Peter Cumpson
Dr John Hedley
Calibration of AFM cantilever stiffness: A microfabricated array of reflective springs2004
Professor Peter Cumpson
Dr John Hedley
Microelectromechanical system device for calibration of atomic force microscope cantilever spring constants, between 0.01 and 4 N/m2004
Professor Peter Cumpson
Dr John Hedley
Quantitative analytical atomic force microscopy: A cantilever reference device for easy and accurate AFM spring-constant calibration2004
Professor Peter Cumpson
Dr John Hedley
Accurate analytical measurements in the atomic force microscope: A microfabricated spring constant standard potentially traceable to the SI2003
Professor Peter Cumpson
Dr John Hedley
Accurate force measurement in the atomic force microscope: A microfabricated array of reference springs for easy cantilever calibration2003
Professor Peter Cumpson
Estimation of inelastic mean free paths for polymers and other organic materials - use of quantitative structure-property relationships2001
Professor Peter Cumpson
The Thickogram: a method for easy film-thickness measurement in XPS2000