Browsing publications by Dr Nick Bennett

Newcastle AuthorsTitleYear
Professor Nick Cowern
Dr Sergei Simdyankin
Dr Chihak Ahn
Dr Nick Bennett
Dr Jonathan Goss
et al.		Extended point defects in crystalline materials: Ge and Si2013
Dr Nick Bennett
Professor Nick Cowern
Doping characterization for germanium-based microelectronics and photovoltaics using the differential Hall technique2012
Dr Nick Bennett
Professor Nick Cowern
Review of electrical characterisation of ultra-shallow junctions with micro four-point probes2010
Dr Nick Bennett
Dr Chihak Ahn
Professor Nick Cowern
Review of Stress Effects on Dopant Solubility in Silicon and Silicon-Germanium Layers2010
Professor Nick Cowern
Dr Nick Bennett
Dr Chihak Ahn
Dr Joo Chul Yoon
Transfer of Physically-Based Models from Process to Device Simulations: Application to Advanced Strained Si/SiGe MOSFETs2010
Dr Nick Bennett
Professor Nick Cowern
Experiments and models for electron mobility as a function of carrier concentration in heavily doped silicon and strained silicon2009
Dr Nick Bennett
Professor Nick Cowern
Model for electron mobility as a function of carrier concentration and strain in heavily doped strained silicon2009
Professor Nick Cowern
Dr Nick Bennett
Dr Chihak Ahn
Dr Joo Chul Yoon
Overlayer stress effects on defect formation in Si and Ge2009
Dr Nick Bennett
Professor Nick Cowern
Photoacoustic spectroscopy at the nanoscale for ultra-shallow implanted silicon2009
Dr Nick Bennett
Professor Nick Cowern
Raman metrology for advanced CMOS devices - advantages and challenges2009
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