Toggle Main Menu Toggle Search

Open Access padlockePrints

Browsing publications by Luke Driscoll.

Newcastle AuthorsTitleYearFull text
Goutan Dalapati
Dr Sanatan Chattopadhyay
Luke Driscoll
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Extraction and modelling of strained-Si MOSFET parameters using small signal channel conductance method2006
Goutan Dalapati
Dr Sanatan Chattopadhyay
Luke Driscoll
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Extraction of strained-Si metal-oxide-semiconductor field-effect transistor parameters using small signal channel conductance method2006
Goutan Dalapati
Dr Kelvin Kwa
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
Thermal oxidation of strained-Si: impact of strained-Si thickness and Ge on Si/SiO2 interface2006
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
et al.
Doubling speed using strained Si/SiGe CMOS technology2005
Dr Kelvin Kwa
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Goutan Dalapati
et al.
Fowler-Nordheim tunnelling in strained Si/SiGe MOS devices: impact of cross-hatching and nanoscale roughness2005
Dr Sarah Olsen
Luke Driscoll
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
High performance strained Si.SiGe n-channel MOSFETs: impact of alloy composition and layer architecture2005
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Piotr Dobrosz
Professor Steve Bull
Luke Driscoll
et al.
Study of strain relaxation in Si/SiGe metal-oxide-semiconductor field-effect transistors2005
Dr Sarah Olsen
Dr Kelvin Kwa
Luke Driscoll
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
Design, fabrication and characterisation of strained Si/SiGe MOS transistors2004
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
et al.
Evaluation of strained Si/SiGe material for high performance CMOS2004
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
et al.
Evaluation of strained Si/SiGe material for high performance CMOS2004
Luke Driscoll
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters2004
Luke Driscoll
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters2004
Luke Driscoll
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters2004
Dr Sarah Olsen
Professor Anthony O'Neill
Luke Driscoll
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
et al.
Optimization of alloy composition for high-performance strained-Si-SiGe N-channel MOSFETs2004
Dr Sarah Olsen
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Luke Driscoll
Professor Anthony O'Neill
et al.
Strained Si/SiGe n-channel MISFETs2004
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Luke Driscoll
Dr Kelvin Kwa
et al.
Study of single- and dual-channel designs for high-performance strained-Si-SiGe n-MOSFETs2004
Dr Sarah Olsen
Professor Anthony O'Neill
Professor Steve Bull
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
et al.
Thermal oxidation of strained Si/SiGe: impact of surface morphology and effect on MOS devices2004
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Dr Nebojsa Jankovic Professor
Dr Sarah Olsen
Luke Driscoll
et al.
A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics2003
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Dr Sarah Olsen
Luke Driscoll
Professor Anthony O'Neill
et al.
Capacitance - Voltage Characterization of Strained Si/SiGe Multiple Heterojunction Capacitors as a Tool for Heterojunction Metal Oxide Semiconductor Field Effect Transistor Channel Design2003
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Dr Sarah Olsen
Luke Driscoll
Professor Anthony O'Neill
et al.
C-V characterization of strained Si/SiGe multiple heterojunction capacitors as a tool for heterojunction MOSFET channel design2003
Dr Sarah Olsen
Luke Driscoll
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
High performance strained Si.SiGe NMOSFETs using a novel CMOS architecture2003
Dr Sarah Olsen
Luke Driscoll
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
High performance strained Si/SiGe n-channel MOSFETs: impact of alloy composition and layer architecture2003
Dr Sarah Olsen
Luke Driscoll
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
High performance strained Si/SiGe nMOSFETs using a novel CMOS architecture2003
Dr Sarah Olsen
Professor Anthony O'Neill
Luke Driscoll
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
et al.
High-performance nMOSFETs using a novel strained Si/SiGe CMOS architecture2003
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
Professor Steve Bull
et al.
Impact of Virtual Substrate Ge Composition on Strained Si MOSFET Performance2003
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
et al.
Impact of virtual substrate Ge composition on strained Si MOSFET performance2003
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
et al.
Impact of virtual substrate growth on high performance strained Si/SiGe double quantum well metal-oxide-semiconductor field-effect transistors2003
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Luke Driscoll
Dr Kelvin Kwa
et al.
N-MOSFET performance in single and dual channel strained Si/SiGe CMOS architectures2003
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
Luke Driscoll
Professor Anthony O'Neill
et al.
Optimisation of channel thickness in strained Si/SiGe MOSFETs2003
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
Luke Driscoll
Professor Anthony O'Neill
et al.
Optimisation of Channel Thickness in Strained Si/SiGe MOSFETs2003
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
Luke Driscoll
Professor Anthony O'Neill
et al.
Optimisation of channel thickness in strained Si/SiGe MOSFETs2003