Publications by Dr Mehdi Kanoun - ePrints

Browsing publications by Dr Mehdi Kanoun.

Newcastle Authors	Title	Year
Liang Yan Dr Sarah Olsen Dr Mehdi Kanoun Rimoon Agaiby Goutan Dalapati et al.	Analysis of gate leakage characteristics in strained Si MOSFETs	2006
Dr Sarah Olsen Dr Mehdi Kanoun Mohamed Al-Areeki Rimoon Agaiby Goutan Dalapati et al.	Analysis of gate leakage in strained Si MOSFETs	2006
Liang Yan Dr Sarah Olsen Dr Mehdi Kanoun Rimoon Agaiby Goutan Dalapati et al.	Analysis of Gate Leakage in Strained Si MOSFETs	2006
Liang Yan Dr Sarah Olsen Dr Mehdi Kanoun Professor Anthony O'Neill	Gate leakage mechanisms in strained Si devices	2006
John Varzgar Dr Mehdi Kanoun Dr Suresh Uppal Dr Sanatan Chattopadhyay Dr Sarah Olsen et al.	Gate Oxide Reliability of Strained Si NMOS Devices Employing a Thin SiFe Strain Relaxed Buffer	2006
Dr Suresh Uppal John Varzgar Dr Mehdi Kanoun Dr Sanatan Chattopadhyay Dr Sarah Olsen et al.	Gate Oxide Reliability on strained Si/SiGe MOS: Effect of Ge content variation	2006
Dr Suresh Uppal Dr Mehdi Kanoun Dr Sanatan Chattopadhyay Rouzet Agaiby Dr Sarah Olsen et al.	Ge out-diffusion and its effect on electrical properties in s-Si/SiGe devices	2006
Dr Suresh Uppal Dr Mehdi Kanoun Dr Sanatan Chattopadhyay Rimoon Agaiby Dr Sarah Olsen et al.	Ge out-diffusion and its effect on electrical properties in s-Si/SiGe devices	2006
Dr Suresh Uppal Dr Mehdi Kanoun John Varzgar Dr Sanatan Chattopadhyay Dr Sarah Olsen et al.	Impact of Ge content on the gate oxide reliability of strained-Si/SiGe MOS devices	2006
Dr Suresh Uppal Dr Mehdi Kanoun John Varzgar Dr Sanatan Chattopadhyay Dr Sarah Olsen et al.	Impact of Ge content on the gate oxide reliability of strained-Si/SiGe MOS devices	2006
John Varzgar Dr Mehdi Kanoun Dr Suresh Uppal Dr Sanatan Chattopadhyay Dr Yuk Tsang et al.	Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures	2006
John Varzgar Dr Mehdi Kanoun Dr Suresh Uppal Dr Sanatan Chattopadhyay Dr Yuk Tsang et al.	Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures	2006