Capacitance-voltage (C-V) technique for the characterisation of stained Si/Si1-xGex hetero-structure MOS devices

  1. Lookup NU author(s)
  2. Dr Sanatan Chattopadhyay
  3. John Varzgar
  4. Dr Johan Seger
  5. Dr Yuk Tsang
  6. Dr Kelvin Kwa
  7. Dr Sarah Olsen
  8. Professor Anthony O'Neill
Author(s)Chattopadhyay S, Varzgar JB, Seger J, Tsang YL, Kwa KSK, Olsen SH, O'Neill AG
Publication type Conference Proceedings (inc. Abstract)
Conference NameEMPDS (Electronic and Photonic Materials, Devices and Systems)
Conference LocationIndia
Year of Conference2006
Source Publication Date4-6 January 2006
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