Defect depth estimation using pulsed eddy current with varied pulse width excitation
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- Professor Gui Yun Tian
- Yong Li
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| Author(s) | | Abidin IZ, Mandache C, Tian GY, Li Y |
| Editor(s) | | |
| Publication type | | Conference Proceedings (inc. Abstract) |
| Conference Name | | Insight: Materials Testing 2008/NDT 2008 Conference |
| Conference Location | | Cheshire, UK |
| Year of Conference | | 2009 |
| Date | | 16-18 September 2008 |
| Volume | | 51, 2 |
| Pages | | 69-72 |
| | 1354-2575 |
| ISBN | | 17544904 |
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| Full text for this publication is not currently held within this repository. Alternative links are provided below where available. |
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| Publisher | | British Institute of Non-Destructive Testing |
| URL | | http://dx.doi.org/10.1784/insi.2009.51.2.69 |
| DOI | | 10.1784/insi.2009.51.2.69 |
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