Defect depth estimation using pulsed eddy current with varied pulse width excitation

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  2. Professor Gui Yun Tian
  3. Yong Li
Author(s)Abidin IZ, Mandache C, Tian GY, Li Y
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference NameInsight: Materials Testing 2008/NDT 2008 Conference
Conference LocationCheshire, UK
Year of Conference2009
Date16-18 September 2008
Volume51, 2
Pages69-72
1354-2575
ISBN17544904
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PublisherBritish Institute of Non-Destructive Testing
URLhttp://dx.doi.org/10.1784/insi.2009.51.2.69
DOI10.1784/insi.2009.51.2.69
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