A C-element latch scheme with increased transient fault tolerance for asynchronous circuits

  1. Lookup NU author(s)
  2. Kelvin Gardiner
  3. Professor Alex Yakovlev
  4. Dr Alex Bystrov
Author(s)Gardiner KT, Yakovlev A, Bystrov A
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference Name13th IEEE International On-Line Testing Symposium Proceedings
Conference LocationHeraklion, Crete, Greece
Year of Conference2007
Date8-11 July 2007
Volume
Pages223-228
ISBN
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PublisherIEEE Computer Society
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