Defect identification in strained Si/SiGe heterolayers for device applications

  1. Lookup NU author(s)
  2. Dr Enrique Escobedo-Cousin
  3. Dr Sarah Olsen
  4. Professor Anthony O'Neill
Author(s)Escobedo-Cousin E, Olsen SH, O'Neill AG, Coulson H
Publication type Article
JournalJournal of Physics D: Applied Physics
Year2009
Volume42
Issue17
Pages6
ISSN (print)0022-3727
ISSN (electronic)1361-6463
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
PublisherInstitute of Physics Publishing Ltd.
URLhttp://dx.doi.org/10.1088/0022-3727/42/17/175306
DOI10.1088/0022-3727/42/17/175306
Actions    Link to this publication
Share