Randomized Radon Signature for face biometric verification

  1. Lookup NU author(s)
  2. Mohammad Dabbah
  3. Professor Satnam Dlay
  4. Dr Wai Lok Woo
Author(s)Dabbah MA, Dlay SS, Woo WL
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference Name15th IEEE International Conference on Image Processing (ICIP 2008)
Conference LocationSan Diego, California, USA
Year of Conference2008
Date12-15 October 2008
Volume
Pages273-276
ISBN9781424417650
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PublisherIEEE
URLhttp://dx.doi.org/10.1109/ICIP.2008.4711744
DOI10.1109/ICIP.2008.4711744
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