Radiation Induced Change in Defect Density in HfO2-Based MIM Capacitors

  1. Lookup NU author(s)
  2. Bing Miao
  3. Dr Rajat Mahapatra
  4. Professor Nick Wright
  5. Dr Alton Horsfall
Author(s)Miao B, Mahapatra R, Jenkins R, Silvie J, Wright NG, Horsfall AB
Publication type Article
JournalIEEE Transactions on Nuclear Science
Year2009
Volume56
Issue5
Pages2916-2924
ISSN (print)0018-9499
ISSN (electronic)1558-1578
Full text is available for this publication:
PublisherIEEE
URLhttp://dx.doi.org/10.1109/TNS.2009.2015314
DOI10.1109/TNS.2009.2015314
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