Investigation of directional eddy current complex measurements for defect mapping

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  2. Anthony Simm
  3. Professor Gui Yun Tian
Author(s)Simm A, Tian GY
Publication type Article
JournalInsight
Year2010
Volume52
Issue6
Pages320-325
ISSN (print)1354-2575
ISSN (electronic)1754-4904
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PublisherBritish Institute of Non-Destructive Testing
URLhttp://dx.doi.org/10.1784/insi.2010.52.6.320
DOI10.1784/insi.2010.52.6.320
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