A Nanoindentation study of the Reduced Elastic Modulus of Alq3 and NPB Thin-film used in OLED Devices

  1. Lookup NU author(s)
  2. Professor Steve Bull
Author(s)Chiang CJ, Bull S, Winscom C, Monkman A
Publication type Article
JournalOrganic Electronics
Year2010
Volume11
Issue3
Pages450-455
ISSN (print)1566-1199
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
Two of the commonly-used Organic Light Emitting Diode (OLED) materials tris-(8-hydroxyquinoline) aluminum (Alq3) and N,N′-bis(naphthalen-1-yl)-N,N′-bis(phenyl)benzidine (NPB) are thermally evaporated as thin-films on two kinds of substrates with different hardness. By using nano-indentation techniques, the reduced elastic modulus of each of the coatings is measured. The data are carefully analysed through the standard Oliver and Pharr method, and the recently developed critical indentation depth method which takes the effect of the substrate more into account.
PublisherElsevier BV
URLhttp://dx.doi.org/10.1016/j.orgel.2009.11.026
DOI10.1016/j.orgel.2009.11.026
Actions    Link to this publication