One-way randomised radon mapping for appearance-based biometric authentication

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  2. Mohammad Dabbah
  3. Professor Satnam Dlay
  4. Dr Wai Lok Woo
Author(s)Dabbah M, Dlay S, Woo W
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference NameIET Conference Publications: 5th International Conference on Visual Information Engineering (VIE)
Conference LocationXi'an, China
Year of Conference2008
Date29 July-1 August 2008
Volume
Pages276-281
ISBN9780863419140
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PublisherIET
URLhttp://dx.doi.org/10.1049/cp:20080322
DOI10.1049/cp:20080322
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