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Accurate Surface-to-Bulk Feature Alignment and Feature Size Preservation During Double-Sided Wafer Processing Using C4F8 Plasma Polymer for the Fabrication of Electrostatically Actuated Cantilever Devices
Lookup NU author(s)
Dr Sunilkumar Rana
Ivano Gregoratto
Pedro Ortiz Bahamon
Dr Alun Harris
Professor James Burdess
Professor Calum McNeil
Author(s)
Rana S, Gregoratto I, Ortiz PM, Harris AJ, Burdess JS, McNeil CJ
Publication type
Article
Journal
Journal of Microelectromechanical Systems
Year
2010
Volume
19
Issue
4
Pages
871-877
ISSN (print)
1057-7157
ISSN (electronic)
1941-0158
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
Publisher
IEEE
URL
http://dx.doi.org?10.1109/JMEMS.2010.2050678
DOI
10.1109/JMEMS.2010.2050678
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