An Analysis of SEU Robustness of C-Element Structures Implemented in Bulk CMOS and SOI Technologies

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  2. Dr Gordon Russell
  3. Professor Alex Yakovlev
Author(s)Al-Tarawneh Z, Russell G, Yakovlev A
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference Name22nd International Conference on Microelectronics (ICM)
Conference LocationCairo, Egypt
Year of Conference2010
Date19-22 December 2010
Volume
Pages280-283
ISBN9781612841496
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PublisherIEEE
URLhttp://dx.doi.org/10.1109/ICM.2010.5696138
DOI10.1109/ICM.2010.5696138
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