Characterising gate dielectrics in high mobility devices using novel nanoscale techniques

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  2. Dr Enrique Escobedo-Cousin
  3. Dr Sarah Olsen
  4. Professor Steve Bull
Author(s)Kapoor R, Escobedo-Cousin E, Olsen S, Bull S
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference NameMicroelectronics Reliability: 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Conference LocationGaeta, Italy
Year of Conference2010
Date11-15 October 2010
Volume50 (9-11)
Pages1484-1487
00262714
ISBN1872941X
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PublisherPergamon
URLhttp://dx.doi.org/10.1016/j.microrel.2010.07.124
DOI10.1016/j.microrel.2010.07.124
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