Effect of Proton Irradiation Induced Defects on 4H-SiC Schottky Diode X-ray Detectors

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  2. Dr Konstantin Vasilevskiy
  3. Professor Nick Wright
  4. Dr Alton Horsfall
Author(s)Stevens RC, Vassilevski K, Lees JE, Wright NG, Horsfall AB
Editor(s)Monakhov, E.V., Hornos, T., Svensson, B.G.
Publication type Conference Proceedings (inc. Abstract)
Conference NameMaterials Science Forum: 8th European Conference on Silicon Carbide and Related Materials
Conference LocationOslo, Norway
Year of Conference2011
Legacy Date29 August - 2 September 2010
Volume679-680
Pages547-550
0255-5476
ISBN
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PublisherTrans Tech Publications Ltd.
URLhttp://dx.doi.org/10.4028/www.scientific.net/MSF.679-680.547
DOI10.4028/www.scientific.net/MSF.679-680.547
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