Effect of Proton Irradiation Induced Defects on 4H-SiC Schottky Diode X-ray Detectors
- Lookup NU author(s)
- Dr Konstantin Vasilevskiy
- Professor Nick Wright
- Dr Alton Horsfall
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| Author(s) | | Stevens RC, Vassilevski K, Lees JE, Wright NG, Horsfall AB |
| Editor(s) | | Monakhov, E.V., Hornos, T., Svensson, B.G. |
| Publication type | | Conference Proceedings (inc. Abstract) |
| Conference Name | | Materials Science Forum: 8th European Conference on Silicon Carbide and Related Materials |
| Conference Location | | Oslo, Norway |
| Year of Conference | | 2011 |
| Date | | 29 August - 2 September 2010 |
| Volume | | 679-680 |
| Pages | | 547-550 |
| | 0255-5476 |
| ISBN | | |
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| Full text for this publication is not currently held within this repository. Alternative links are provided below where available. |
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| Publisher | | Trans Tech Publications Ltd. |
| URL | | http://dx.doi.org/10.4028/www.scientific.net/MSF.679-680.547 |
| DOI | | 10.4028/www.scientific.net/MSF.679-680.547 |
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