M-PRES: a statistical tool for modelling the impact of manufacturing process variations on circuit-level performance parameters

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  2. Santosh Shedabale
  3. Dr Gordon Russell
  4. Professor Alex Yakovlev
Author(s)Shedabale S; Russell G; Yakovlev A
Publication type Article
JournalIET Circuits, Devices and Systems Series
Year2011
Volume5
Issue5
Pages403-410
ISSN (print)1751-858X
ISSN (electronic)1751-8598
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PublisherThe Institution of Engineering and Technology
URLhttp://dx.doi.org/10.1049/iet-cds.2010.0110
DOI10.1049/iet-cds.2010.0110
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