Pulsed eddy current systems for defect and geometrical profile measurement

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  2. Professor Gui Yun Tian
  3. Anthony Simm
Author(s)Tian GY, He YZ, Simm A
Editor(s)Fan, K.C., Lu, R.S., Song, M.
Publication type Conference Proceedings (inc. Abstract)
Conference Name7th International Symposium on Precision Engineering Measurements and Instrumentation (ISPEMI)
Conference LocationLijiang, China
Year of Conference2011
Date7-11 August 2011
Volume8321
Pages832143
Series TitleProceedings of SPIE
0277-786X
ISBN9780819479402
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PublisherSPIE
URLhttp://dx.doi.org/10.1117/12.912719
DOI10.1117/12.912719
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