Modelling Faults and Fault Tolerance Mechanisms in a Paper Pinch Co- model

  1. Lookup NU author(s)
  2. Dr Ken Pierce
  3. Professor John Fitzgerald
  4. Dr Carl Gamble
Author(s)Pierce KG, Fitzgerald JS, Gamble C
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference NameERCIM/EWICS/Cyber-physical Systems Workshop at SafeComp
Conference LocationNaples, Italy
Year of Conference2011
Legacy Date19-22 September 2011
Volume
Pages
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
This paper demonstrates the modelling and simulation of errors and fault tolerance mechanisms for embedded systems, using co-models that combine discrete-event models of control software with continuous-time models of controlled plant. The approach has been realised using the VDM and 20-sim formalisms with a co-simulation engine that coordinates simulations running in their respective tools. The paper introduces the use of patterns for the formal modelling of errors and fault tolerance mechanisms in this setting, giving illustrative safety kernel and voter patterns, demonstrating their application in a case study based on paper processing machinery.
NotesText also available as a school technical report at http://www.cs.ncl.ac.uk/publications/trs/papers/1280.pdf