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Evaluation of strained Si/SiGe material for high performance CMOS
Lookup NU author(s)
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
Dr David Robbins
Dr Jun Zhang
Author(s)
Olsen SH, O'Neill AG, Chattopadhyay S, Kwa KSK, Driscoll LS, Norris DJ, Cullis AG, Robbins DJ, Zhang J
Publication type
Article
Journal
Journal of Applied Physics
Year
2004
Volume
95
Issue
10
Pages
5931-5933
ISSN (print)
0021-8979
ISSN (electronic)
1089-7550
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
Publisher
American Institute of Physics
URL
http://dx.doi.org/10.1063/1.1691177
DOI
10.1063/1.1691177
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