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Unsupervised Sparse Pattern Diagnostic of Defects with Inductive Thermography Imaging System

Lookup NU author(s): Professor Bin Gao, Dr Wai Lok Woo, Professor Gui Yun TianORCiD

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This is the of an article that has been published in its final definitive form by IEEE, 2016.

For re-use rights please refer to the publisher's terms and conditions.

Publication metadata

Author(s): Gao B, Woo WL, He Y, Tian GY

Publication type: Article

Publication status: Published

Journal: IEEE Transactions on Industrial Informatics

Year: 2016

Volume: 12

Issue: 1

Pages: 371-383

Print publication date: 03/02/2016

Online publication date: 26/10/2015

Acceptance date: 01/07/2015

Date deposited: 10/06/2020

ISSN (print): 1551-3203

ISSN (electronic): 1941-0050

Publisher: IEEE

URL: http://dx.doi.org/10.1109/TII.2015.2492925

DOI: 10.1109/TII.2015.2492925

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Funding

Funder referenceFunder name
U1430115NSAF
ZYGX2014J068Fundamental Research Funds for the Central Universities
136413China Postdoctoral Science Foundation
269202FP7 HEMOW IRSES project
51377015National Natural Science Foundation of China
2013HH0059Science and Technology Department of Sichuan Province, China
61401071National Natural Science Foundation of China
61527803National Natural Science Foundation of China
EP/D079179/1Engineering and Physical Sciences Research Council
F011404National Natural Science Foundation of China

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