Low Cost HighTemperature Test System for SoI Devices

  1. Lookup NU author(s)
  2. Dr Gordon Russell
  3. Yong Li
  4. Henning Bahr
Author(s)Russell G, Li Y, Bahr H
Editor(s)Nazarov, A.N., Flandre, D., Hemment, P.L.F.
Publication type Book Chapter
Book TitleScience and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment
Series TitleNATO Science Series
Year2005
Volume
Pages241-246
ISBN9781402030123
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PublisherSpringer
Place PublishedBerlin; New York
ActionsLink to this publication
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