Characterisation of 4H-SiC MOS capacitor with a protective coating for harsh environments applications

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  2. Sandip Roy
  3. Dr Jesus Urresti Ibanez
  4. Professor Anthony O'Neill
  5. Professor Nick Wright
  6. Dr Alton Horsfall
Author(s)Roy SK, Ibanez JU, O'Neill AG, Wright NG, Horsfall AB
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference Name2016 European Conference on Silicon Carbide & Related Materials (ECSCRM)
Conference LocationHalkidiki, Greece
Year of Conference2017
Source Publication Date2017
Volume897
Pages327-330
Series TitleMaterials Science Forum
0255-5476
ISBN9783035710434
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PublisherTrans Tech Publications Ltd
URLhttps://doi.org/10.4028/www.scientific.net/MSF.897.327
DOI10.4028/www.scientific.net/MSF.897.327
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