Transient out-of-SOA robustness of SiC power MOSFETs

  1. Lookup NU author(s)
  2. Asad Fayyaz
  3. Dr Jesus Urresti Ibanez
  4. Professor Nick Wright
Author(s)Castellazzi A, Fayyaz A, Romano G, Riccio M, Irace A, Urresti-Ibanez J, Wright N
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference Name2017 IEEE International Reliability Physics Symposium (IRPS)
Conference LocationCalifornia, USA
Year of Conference2017
Source Publication Date30 May 2017
Volume
Pages2A31-2A38
1541-7026
ISBN9781509066407
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
PublisherIEEE
URLhttps://doi.org/10.1109/IRPS.2017.7936255
DOI10.1109/IRPS.2017.7936255
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