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Lookup NU author(s): Richard Mandeya, Cuili Chen, Professor Volker Pickert, Dr Naayagi Ramasamy
This is the authors' accepted manuscript of a letter published in its final definitive form in 2018. For re-use rights please refer to the publishers terms and conditions.
Temperature Sensitive Electrical Parameters (TSEPs) are promising for measurement of the IGBT chip temperature, Tchip. Many TSEPs have been proposed in the literature and most require current sensors, and convoluted hardware and data processing, which are associated with increased complexity and cost. In this letter, a new TSEP is proposed called pre-threshold TSEP, VGE(pre-th). VGE(pre-th) requires only a voltage sensor and a counter. Besides less hardware requirement, VGE(pre-th) does not suffer from self-heating – a problem that most TSEPs encounter. This letter presents the operation of VGE(pre-th) with the help of simulation. Experimental tests on a 3.3kV, 800A IGBT were conducted to characterize VGE(pre-th). It is shown that the new TSEP proposed has a sensitivity of -2.2mV/°C.
Author(s): Mandeya R, Chen C, Pickert V, Naayagi RT
Publication type: Letter
Publication status: Published
Journal: IEEE Transactions on Power Electronics
Year: 2018
Volume: 33
Issue: 4
Pages: 2787-2791
Print publication date: 01/04/2018
Online publication date: 04/09/2017
Acceptance date: 20/08/2017
ISSN (print): 0885-8993
ISSN (electronic): 1941-0107
URL: https://doi.org/10.1109/TPEL.2017.2749179
DOI: 10.1109/TPEL.2017.2749179
