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Capacitance - Voltage Characterization of Strained Si/SiGe Multiple Heterojunction Capacitors as a Tool for Heterojunction Metal Oxide Semiconductor Field Effect Transistor Channel Design

Lookup NU author(s): Dr Sanatan Chattopadhyay, Dr Kelvin Kwa, Dr Sarah Olsen, Luke Driscoll, Professor Anthony O'Neill

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Author(s): Chattopadhyay S, Kwa KSK, Olsen SH, Driscoll LS, ONeill AG

Publication type: Article

Publication status: Published

Journal: Semiconductor Science and Technology

Year: 2003

Volume: 18

Issue: 8

Pages: 738-744

Print publication date: 01/01/2003

ISSN (print): 0268-1242

ISSN (electronic): 1361-6641

Publisher: Institute of Physics Publishing

URL: http://dx.doi.org/10.1088/0268-1242/18/8/304

DOI: 10.1088/0268-1242/18/8/304

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