Browse by author
Lookup NU author(s): Professor Nick Wright, Dr Christopher Johnson, Professor Anthony O'Neill
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
Surface passivation of high voltage GaAs Schottky diodes by sulphur containing solutions is investigated. A range of diodes with maximum voltage ratings in excess of 100 V were fabricated using Na2S or (NH4)2SX chemical treatments prior to Schottky deposition. It is demonstrated that, whilst Na2S might provide an efficient passivation at low reverse biases, diodes passivated with this chemical showed little reduction in reverse leakage current under high reverse voltages. By contrast, (NH4)2SX is shown to be an effective surface passivation under reverse bias in excess of 200 V - reducing leakage currents by at least two orders of magnitude in simple diodes (from 10-2 to 10-4 A cm-2) and extending the breakdown voltage of mesa terminated diodes from 150 to 250 V. © 1998 Elsevier Science Ltd. All rights reserved.
Author(s): Wright NG, Johnson CM, O'Neill AG
Publication type: Article
Publication status: Published
Journal: Solid-State Electronics
Year: 1998
Volume: 42
Issue: 3
Pages: 437-440
Print publication date: 30/03/1998
ISSN (print): 0038-1101
ISSN (electronic): 1879-2405
Publisher: Pergamon
URL: http://dx.doi.org/10.1016/S0038-1101(97)00275-X
DOI: 10.1016/S0038-1101(97)00275-X
Altmetrics provided by Altmetric
