Quantifying Self-Heating Effects in Strained Si MOSFETs with Scaling

  1. Lookup NU author(s)
  2. Rimoon Agaiby
  3. Professor Anthony O'Neill
  4. Dr Sarah Olsen
Author(s)Agaiby R, O'Neill AG, Olsen SH, Eneman G, Verheyen P, Loo R, Claeys C
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference NameProceeding of the 36th European Solid-State Device Research Conference (ESSDERC)
Conference LocationMontreux, France
Year of Conference2006
Date19-21 September 2006
Volume
Pages97-100
ISBN1424403014
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PublisherIEEE
URLhttp://dx.doi.org/10.1109/ESSDER.2006.307647
DOI10.1109/ESSDER.2006.307647
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