Quantifying Self-Heating Effects in Strained Si MOSFETs with Scaling

  1. Lookup NU author(s)
  2. Rimoon Agaiby
  3. Professor Anthony O'Neill
  4. Dr Sarah Olsen
Author(s)Agaiby R, O'Neill AG, Olsen SH, Eneman G, Verheyen P, Loo R, Claeys C
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference NameProceeding of the 36th European Solid-State Device Research Conference (ESSDERC)
Conference LocationMontreux, France
Year of Conference2006
Legacy Date19-21 September 2006
Volume
Pages97-100
ISBN1424403014
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
PublisherIEEE
URLhttp://dx.doi.org/10.1109/ESSDER.2006.307647
DOI10.1109/ESSDER.2006.307647
ActionsLink to this publication
Library holdingsSearch Newcastle University Library for this item