Secure face biometric verification in the randomized Radon space

  1. Lookup NU author(s)
  2. Mohammad Dabbah
  3. Dr Wai Lok Woo
  4. Professor Satnam Dlay
Author(s)Dabbah MA, Woo WL, Dlay SS
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference NameIEEE International Conference on Multimedia and Expo (ICME)
Conference LocationHannover, Germany
Year of Conference2008
Legacy Date23-26 June 2008
Volume
Pages909-912
ISBN9781424425709
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PublisherIEEE
URLhttp://dx.doi.org/10.1109/ICME.2008.4607583
DOI10.1109/ICME.2008.4607583
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