Scanning electron acoustic microscopy (SEAM): A technique for the detection of contact-induced surface & sub-surface cracks

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  2. Professor Trevor Page
  3. Dr Brian Shaw
Author(s)Page TF, Shaw BA
Publication type Article
JournalJournal of Materials Science
Year2004
Volume39
Issue22
Pages6791-6805
ISSN (print)0022-2461
ISSN (electronic)1573-4803
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PublisherSpringer New York LLC
URLhttp://dx.doi.org/10.1023/B:JMSC.0000045607.19879.a4
DOI10.1023/B:JMSC.0000045607.19879.a4
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