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Evaluation of strained Si/SiGe material for high performance CMOS
Lookup NU author(s)
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
Dr David Robbins
Author(s)
Olsen SH, O'Neill AG, Chattopadhyay S, Kwa KSK, Driscoll LS, Norris DJ, Cullis AG, Robbins DJ, Zhang J
Publication type
Article
Journal
Semiconductor Science and Technology
Year
2004
Volume
19
Issue
6
Pages
707-714
ISSN (print)
0268-1242
ISSN (electronic)
1361-6641
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
Publisher
Institute of Physics Publishing Ltd.
URL
http://dx.doi.org/10.1088/0268-1242/19/6/008
DOI
10.1088/0268-1242/19/6/008
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