One-way randomised Radon mapping for appearance-based biometric authentication
- Lookup NU author(s)
- Mohammad Dabbah
- Dr Wai Lok Woo
- Professor Satnam Dlay
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| Author(s) | | Dabbah MA, Woo WL, Dlay SS |
| Editor(s) | | |
| Publication type | | Conference Proceedings (inc. Abstract) |
| Conference Name | | 5th International Conference on Visual Information Engineering (VIE 2008) |
| Conference Location | | Xi'an, China |
| Year of Conference | | 2008 |
| Date | | 29 July - 1 August 2008 |
| Volume | | |
| Pages | | 276-281 |
| ISBN | | 9780863419140 |
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| Full text for this publication is not currently held within this repository. Alternative links are provided below where available. |
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| Publisher | | Institution of Engineering and Technology (IET) |
| Actions | |  |
| Library holdings | | Search Newcastle University Library for this item |
