One-way randomised Radon mapping for appearance-based biometric authentication

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  2. Mohammad Dabbah
  3. Dr Wai Lok Woo
  4. Professor Satnam Dlay
Author(s)Dabbah MA, Woo WL, Dlay SS
Publication type Conference Proceedings (inc. Abstract)
Conference Name5th International Conference on Visual Information Engineering (VIE 2008)
Conference LocationXi'an, China
Year of Conference2008
Legacy Date29 July - 1 August 2008
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PublisherInstitution of Engineering and Technology (IET)
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