One-way randomised Radon mapping for appearance-based biometric authentication

  1. Lookup NU author(s)
  2. Mohammad Dabbah
  3. Dr Wai Lok Woo
  4. Professor Satnam Dlay
Author(s)Dabbah MA, Woo WL, Dlay SS
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference Name5th International Conference on Visual Information Engineering (VIE 2008)
Conference LocationXi'an, China
Year of Conference2008
Date29 July - 1 August 2008
Volume
Pages276-281
ISBN9780863419140
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PublisherInstitution of Engineering and Technology (IET)
ActionsLink to this publication
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