Extending boundary-scan to perform a memory built-in self-test

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  2. Henning Bahr
  3. Dr Gordon Russell
  4. Dr Yajian Li
Author(s)Bahr H, Russell G, Li Y
Publication type Article
JournalWSEAS Transactions on Electronics
Year2005
Volume2
Issue4
Pages161-165
ISSN (print)1109-9445
ISSN (electronic)
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PublisherWorld Scientific and Engineering Academy and Society
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