An investigation of electrical and structural properties of Ni-germanosilicided Schottky diode

  1. Lookup NU author(s)
  2. Arup Saha
  3. Dr Sanatan Chattopadhyay
  4. Goutan Dalapati
Author(s)Saha AR, Chattopadhyay S, Dalapati GK, Nandi SK, Maiti CK
Publication type Article
JournalMicroelectronics Reliability
Year2005
Volume45
Issue7-8
Pages1154-1160
ISSN (print)0026-2714
ISSN (electronic)1872-941X
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
PublisherPergamon
URLhttp://dx.doi.org/10.1016/j.microrel.2004.08.012
DOI10.1016/j.microrel.2004.08.012
Actions    Link to this publication