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Sensitivity of a rotating beam sensor for stress evaluation in aluminium thin films
Lookup NU author(s)
Dr Alton Horsfall
Professor Nick Wright
Sorin Soare
Professor Steve Bull
Professor Anthony O'Neill
Author(s)
Dos Santos JMM, Pina JCP, Batista AC, Horsfall AB, Wang K, Wright NG, Soare SM, Bull SJ, O'Neill AG, Terry JG, Walton AJ, Gundlach AM, Stevenson JTM
Editor(s)
Publication type
Conference Proceedings (inc. Abstract)
Conference Name
Materials Science Forum
Conference Location
Xi'an, China
Year of Conference
2005
Date
14-17 June 2004
Volume
490-491
Pages
649-654
0255-5476
ISBN
0878499695
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
Publisher
Trans Tech Publications Ltd.
URL
http://dx.doi.org/10.4028/www.scientific.net/MSF.490-491.649
DOI
10.4028/www.scientific.net/MSF.490-491.649
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