On-chip measurement of deep metastability in synchronizers

  1. Lookup NU author(s)
  2. Jun Zhou
  3. Professor David Kinniment
  4. Dr Gordon Russell
  5. Professor Alex Yakovlev
Author(s)Zhou J, Kinniment DJ, Dike C, Russell G, Yakovlev A
Publication type Article
JournalIEEE Journal of Solid-State Circuits
Year2008
Volume43
Issue2
Pages550-557
ISSN (print)0018-9200
ISSN (electronic)1558-173X
Full text is available for this publication:
PublisherIEEE
URLhttp://dx.doi.org/10.1109/JSSC.2007.913160
DOI10.1109/JSSC.2007.913160
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