Nanometer strain profiling through Si/SiGe quantum layers

  1. Lookup NU author(s)
  2. Rouzet Agaiby
  3. Dr Sarah Olsen
  4. Dr Piotr Dobrosz
  5. Professor Steve Bull
  6. Professor Anthony O'Neill
Author(s)Agaiby RMB, Olsen SH, Dobrosz P, Coulson H, Bull SJ, O'Neill AG
Publication type Article
JournalJournal of Applied Physics
Year2008
Volume104
Issue1
Pages
ISSN (print)0021-8979
ISSN (electronic)1520-8850
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PublisherAmerican Institute of Physics
URLhttp://dx.doi.org/10.1063/1.2936883
DOI10.1063/1.2936883
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