Analysing the Effect of Process Variation to Reduce Parametric Yield Loss

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  2. Santosh Shedabale
  3. Dr Gordon Russell
  4. Professor Alex Yakovlev
Author(s)Ramakrishnan H, Shedabale S, Russell G, Yakovlev A
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference NameIEEE International Conference on Integrated Circuit Design and Technology and Tutorial, ICICDT 2008
Conference LocationMinatec, Grenoble, France
Year of Conference2008
Date2-4 June 2008
Volume
Pages171-176
ISBN9781424418114
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PublisherIEEE
URLhttp://dx.doi.org/10.1109/ICICDT.2008.4567272
DOI10.1109/ICICDT.2008.4567272
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