Metastable VO2 complexes in silicon: experimental and theoretical modeling studies

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  2. Dr Jose Coutinho
  3. Richard Jones
  4. Professor Patrick Briddon
Author(s)Murin LI, Lindstrom J, Markevich VP, Medvedeva IF, Torres VJB, Coutinho J, Jones R, Briddon PR
Editor(s)Pichaud, B., Claverie, A.
Publication type Conference Proceedings (inc. Abstract)
Conference NameGettering and Defect Engineering in Semiconductor Technology XI: Proceedings of the 11th International Autumn Meeting
Conference LocationGiens, France
Year of Conference2005
Date25-30 September 2005
Volume108-109
Pages223-228
ISBN9783908451136
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PublisherTrans Tech Publications Ltd.
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