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On-line Monitoring of the MOSFET Device Junction Temperature by Computation of the Threshold Voltage

Lookup NU author(s): Professor Volker Pickert, Dr Len Pritchard

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Publication metadata

Author(s): Huifeng C, Pickert V, Atkinson V, Pritchard L

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: The 3rd IET International Conference on Power Electronics, Machines and Drives (PEMD)

Year of Conference: 2006

Pages: 440-444

Publisher: IET

URL: http://ieeexplore.ieee.org/iel5/4123465/4123466/04123561.pdf

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