Characterization of Metal-Semiconductor Heterointerface using Capacitance-Voltage Technique

  1. Lookup NU author(s)
  2. Arup Saha
  3. Dr Sanatan Chattopadhyay
Author(s)Saha AR, Chattopadhyay S, Bose C, Maiti CK
Editor(s)
Publication type Conference Proceedings (inc. Abstract)
Conference Name14th International Conference on Silicon Epitaxy and Heterostructures (ICSI-4)
Conference LocationAwaji Island, Hyogo, Japan
Year of Conference2005
Date23-26 May 2005
Volume
Pages
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