Characterization of Metal-Semiconductor Heterointerface using Capacitance-Voltage Technique

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  2. Arup Saha
  3. Dr Sanatan Chattopadhyay
Author(s)Saha AR, Chattopadhyay S, Bose C, Maiti CK
Publication type Conference Proceedings (inc. Abstract)
Conference Name14th International Conference on Silicon Epitaxy and Heterostructures (ICSI-4)
Conference LocationAwaji Island, Hyogo, Japan
Year of Conference2005
Legacy Date23-26 May 2005
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