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Increased flicker noise with increasing Ge concentration in the virtual substrate of strained Si surface channel n-MOSFETs

Lookup NU author(s): Dr Sarah Olsen

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Publication metadata

Author(s): Fobelets K, Rumyantsev SL, Olsen SH, Shur MS

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Unknown

Conference Name: Advanced workshop on Frontiers in Electronics (WOFE)

Year of Conference: 2007

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