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Capacitance-voltage (C-V) technique for the characterisation of strained Si/Si1-xGex hetero-structure MOS devices

Lookup NU author(s): Dr Sanatan Chattopadhyay, John Varzgar, Dr Johan Seger, Dr Yuk Tsang, Dr Kelvin Kwa, Dr Sarah Olsen, Professor Anthony O'Neill

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Author(s): Chattopadhyay S, Varzgar JB, Seger J, Tsang YL, Kwa KSK, Olsen SH, O'Neill AG

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: International Conference on Electronic and Photonic Material, Devices and Systems (EPMDS 2006)

Year of Conference: 2006

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