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Temperature sensitivity of DC operation of sub-micron strained-Si MOSFETs

Lookup NU author(s): Dr Sarah Olsen, Professor Anthony O'Neill

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Author(s): Olsen SH; O'Neill AG; Gaspari V; Fobelets K; Velazquez-Perez JE; Zhang J

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Proceedings of the Electronics Materials Conference

Year of Conference: 2004

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