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High Temperature Storage for Energy Harvesting in Hostile Environments

Lookup NU author(s): Simon Barker, Bing Miao, Daniel Brennan, Professor Nick Wright, Dr Alton Horsfall

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Abstract

This work presents the first demonstration of high temperature energy storage, using HfO2 MIM capacitors, for energy scavenging in hostile environments. The work builds upon previous efforts to make capacitors operational at temperatures in excess of 600K and aims to provide a scalable capacitor based storage technology. Presented are the results of storage decay for both 35nm and 60nm HfO2 dielectrics with device areas between 0.785x10(-4) cm(2) and 1.02x10(-3) cm(2). Results show a 10 fold reduction in open circuit voltage decay (OCVD) rate for the thicker dielectric devices. It was also shown that the OCVD rate can be decreased with serial connection of the capacitors, further increasing the stability of the stored voltage with temperature. The effect of reducing the capacitance by increasing the dielectric thickness does not have a detrimental effect on the OCVD rate due to the substantial reduction in dielectric leakage.


Publication metadata

Author(s): Barker S, Miao B, Brennan D, Wright NG, Horsfall AB

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: IEEE Sensors

Year of Conference: 2009

Pages: 777-780

ISSN: 1930-0395

Publisher: IEEE

URL: http://dx.doi.org/10.1109/ICSENS.2009.5398533

DOI: 10.1109/ICSENS.2009.5398533

Library holdings: Search Newcastle University Library for this item

ISBN: 9781424445486


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