Toggle Main Menu Toggle Search

Open Access padlockePrints

Testability and Test Compaction for Decision Diagram Circuits

Lookup NU author(s): Dr Alex Bystrov

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


Publication metadata

Author(s): Bystrov A, Almaini AEA

Publication type: Article

Publication status: Published

Journal: IEE Proceedings - Circuits, Devices and Systems

Year: 1999

Volume: 146

Issue: 4

Pages: 153-158

Print publication date: 01/01/1999

ISSN (print): 1350-2409

Publisher: Institution of Electrical Engineers (IEE)

URL: http://dx.doi.org/10.1049/ip-cds:19990536

DOI: 10.1049/ip-cds:19990536


Altmetrics

Altmetrics provided by Altmetric


Actions

Find at Newcastle University icon    Link to this publication


Share